Charge Transport and Contact Effects in Nanoscale Electrical Junctions Formed Via Conducting Probe Atomic Force Microscopy
Download or Read eBook Charge Transport and Contact Effects in Nanoscale Electrical Junctions Formed Via Conducting Probe Atomic Force Microscopy PDF written by Jeremy Matthew Beebe and published by . This book was released on 2005 with total page 370 pages. Available in PDF, EPUB and Kindle.
| Author | : Jeremy Matthew Beebe |
| Publisher | : |
| Total Pages | : 370 |
| Release | : 2005 |
| ISBN-10 | : MINN:31951P00786459B |
| ISBN-13 | : |
| Rating | : 4/5 (9B Downloads) |
Book Synopsis Charge Transport and Contact Effects in Nanoscale Electrical Junctions Formed Via Conducting Probe Atomic Force Microscopy by : Jeremy Matthew Beebe
Book excerpt:
