Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Download or Read eBook Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits PDF written by Manoj Sachdev and published by Springer Science & Business Media. This book was released on 2007-06-04 with total page 343 pages. Available in PDF, EPUB and Kindle.
| Author | : Manoj Sachdev |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 343 |
| Release | : 2007-06-04 |
| ISBN-10 | : 9780387465470 |
| ISBN-13 | : 0387465472 |
| Rating | : 4/5 (70 Downloads) |
Book Synopsis Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits by : Manoj Sachdev
Book excerpt: The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.
