Related Books

Handbook of Critical Dimension Metrology and Process Control
Language: en
Pages: 376
Authors: Kevin M. Monahan
Categories: Electronic industries
Type: BOOK - Published: 1994 - Publisher: SPIE-International Society for Optical Engineering

DOWNLOAD EBOOK

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics
Handbook of Silicon Semiconductor Metrology
Language: en
Pages: 703
Authors: Alain C. Diebold
Categories: Technology & Engineering
Type: BOOK - Published: 2001-06-29 - Publisher: CRC Press

DOWNLOAD EBOOK

Containing more than 300 equations and nearly 500 drawings, photographs, and micrographs, this reference surveys key areas such as optical measurements and in-l
National Semiconductor Metrology Program
Language: en
Pages: 160
Authors: National Institute of Standards and Technology (U.S.)
Categories: Semiconductors
Type: BOOK - Published: 2000 - Publisher:

DOWNLOAD EBOOK

Integrated Circuit Metrology, Inspection, and Process Control
Language: en
Pages: 340
Authors: Kevin M. Monahan
Categories: Technology & Engineering
Type: BOOK - Published: 1987 - Publisher:

DOWNLOAD EBOOK

National Semiconductor Metrology Program
Language: en
Pages: 82
Authors: National Semiconductor Metrology Program (U.S.)
Categories: Semiconductors
Type: BOOK - Published: - Publisher:

DOWNLOAD EBOOK