Modeling Charged Defects and Defects Levels in Semiconductors and Oxides with DFT
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| Author | : |
| Publisher | : |
| Total Pages | : 58 |
| Release | : 2015 |
| ISBN-10 | : OCLC:953408762 |
| ISBN-13 | : |
| Rating | : 4/5 (62 Downloads) |
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