Scanning Probe Characterization of Novel Semiconductor Materials and Devices
Download or Read eBook Scanning Probe Characterization of Novel Semiconductor Materials and Devices PDF written by Xiaotian Zhou and published by . This book was released on 2007 with total page 127 pages. Available in PDF, EPUB and Kindle.
| Author | : Xiaotian Zhou |
| Publisher | : |
| Total Pages | : 127 |
| Release | : 2007 |
| ISBN-10 | : 9984343146 |
| ISBN-13 | : 9789984343143 |
| Rating | : 4/5 (46 Downloads) |
Book Synopsis Scanning Probe Characterization of Novel Semiconductor Materials and Devices by : Xiaotian Zhou
Book excerpt: As semiconductor devices shrink in size, it becomes more important to characterize and understand electronic properties of the materials and devices at the nanoscale. Scanning probe techniques offers numerous advantages over traditional tools used for semiconductor materials and devices characterization including high spatial resolution, ease of use and multi-functionality for electrical characterization, such as current, potential and capacitance, etc.
