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Development and Investigation of Novel Logic-in-Memory and Nonvolatile Logic Circuits Utilizing Hafnium Oxide-Based Ferroelectric Field-Effect Transistors
Language: en
Pages: 216
Authors: Evelyn Tina Breyer
Categories: Technology & Engineering
Type: BOOK - Published: 2022-02-08 - Publisher: BoD – Books on Demand

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Not only conventional computer architectures, such as the von-Neumann architecture with its inevitable von-Neumann bottleneck, but likewise the emerging field o
Ferroelectric-Gate Field Effect Transistor Memories
Language: en
Pages: 421
Authors: Byung-Eun Park
Categories: Technology & Engineering
Type: BOOK - Published: 2020-03-23 - Publisher: Springer Nature

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This book provides comprehensive coverage of the materials characteristics, process technologies, and device operations for memory field-effect transistors empl
Atomic Layer Deposition for Semiconductors
Language: en
Pages: 266
Authors: Cheol Seong Hwang
Categories: Science
Type: BOOK - Published: 2013-10-18 - Publisher: Springer Science & Business Media

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Offering thorough coverage of atomic layer deposition (ALD), this book moves from basic chemistry of ALD and modeling of processes to examine ALD in memory, log
Resistive Random Access Memory (RRAM)
Language: en
Pages: 71
Authors: Shimeng Yu
Categories: Technology & Engineering
Type: BOOK - Published: 2022-06-01 - Publisher: Springer Nature

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RRAM technology has made significant progress in the past decade as a competitive candidate for the next generation non-volatile memory (NVM). This lecture is a
Ferroelectricity in Doped Hafnium Oxide
Language: en
Pages: 572
Authors: Uwe Schroeder
Categories: Technology & Engineering
Type: BOOK - Published: 2019-03-27 - Publisher: Woodhead Publishing

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Ferroelectricity in Doped Hafnium Oxide: Materials, Properties and Devices covers all aspects relating to the structural and electrical properties of HfO2 and i