Related Books
Language: en
Pages:
Pages:
Type: BOOK - Published: 2022-05-12 - Publisher: Cambridge University Press
Learn to assess electromigration reliability and design more resilient chips in this comprehensive and practical resource. Beginning with fundamental physics an
Language: en
Pages: 171
Pages: 171
Type: BOOK - Published: 2018-02-23 - Publisher: Springer
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of
Language: en
Pages: 433
Pages: 433
Type: BOOK - Published: 2022-05-12 - Publisher: Cambridge University Press
Learn to assess electromigration reliability and design more resilient chips in this comprehensive and practical resource. Beginning with fundamental physics an
Language: en
Pages: 214
Pages: 214
Type: BOOK - Published: 1985 - Publisher:
Language: en
Pages: 506
Pages: 506
Type: BOOK - Published: 2012-12-02 - Publisher: Elsevier
Diffusion in Solids: Recent Developments provides an overview of diffusion in crystalline solids. This book discusses the various aspects of the theory of diffu
