Covers the statistical analysis and optimization issues arising due to increased process variations in current technologies. Comprises a valuable reference for

Covers the statistical analysis and optimization issues arising due to increased process variations in current technologies. Comprises a valuable reference for

Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and effici

Recent years have seen rapid strides in the level of sophistication of VLSI circuits. On the performance front, there is a vital need for techniques to design f