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Structural Analysis of Point Defects in Solids
Language: en
Pages: 376
Authors: Johann-Martin Spaeth
Categories: Science
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

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Strutural Analysis of Point Defects in Solids introduces the principles and techniques of modern electron paramagnetic resonance (EPR) spectroscopy essentialfor
Point Defects in Semiconductors and Insulators
Language: en
Pages: 508
Authors: Johann-Martin Spaeth
Categories: Technology & Engineering
Type: BOOK - Published: 2003-01-22 - Publisher: Springer Science & Business Media

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The precedent book with the title "Structural Analysis of Point Defects in Solids: An introduction to multiple magnetic resonance spectroscopy" ap peared about
Point Defects in Semiconductors and Insulators
Language: en
Pages: 497
Authors: Johann-Martin Spaeth
Categories: Technology & Engineering
Type: BOOK - Published: 2013-04-17 - Publisher: Springer Science & Business Media

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The precedent book with the title "Structural Analysis of Point Defects in Solids: An introduction to multiple magnetic resonance spectroscopy" ap peared about
Point Defects in Solids
Language: en
Pages:
Authors: James H. Crawford
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Type: BOOK - Published: 1972 - Publisher:

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Structural Analysis of Point Defects in Solids
Language: en
Pages: 386
Authors: Johann-Martin Spaeth
Categories:
Type: BOOK - Published: 1992-11-05 - Publisher:

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