Advancing Metrology for Electrotechnology to Support the U.S. Economy
Download or Read eBook Advancing Metrology for Electrotechnology to Support the U.S. Economy PDF written by Joanne Surette and published by DIANE Publishing. This book was released on 1999-04 with total page 85 pages. Available in PDF, EPUB and Kindle.
Author | : Joanne Surette |
Publisher | : DIANE Publishing |
Total Pages | : 85 |
Release | : 1999-04 |
ISBN-10 | : 9780788177019 |
ISBN-13 | : 078817701X |
Rating | : 4/5 (19 Downloads) |
Book Synopsis Advancing Metrology for Electrotechnology to Support the U.S. Economy by : Joanne Surette
Book excerpt: Presents an overview of work completed in 1997 in the Electronics & Electrical Engineering Laboratory (EEEL) of the National Institute of Standards & Technology. Selected technological accomplishments in the following fields are detailed: semiconductors, magnetics, superconductors, low frequency, microwaves, lightwaves, video, power, electromagnetic compatibility, electronic data exchange, & national electrical standards. Includes a profile of EEEL & its programs, projects, executive structure, awards & recognition, & management staff. Photographs, graphs & diagrams.