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Language: en
Pages: 269
Pages: 269
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media
Discusses silicon oxidation in a tutorial fashion from both experimental and theoretical viewpoints. The authors report on the state of the art both at Lucent T
Language: en
Pages: 503
Pages: 503
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media
An extrapolation of ULSI scaling trends indicates that minimum feature sizes below 0.1 mu and gate thicknesses of Audience: Both expert scientists and engineers
Language: en
Pages: 2242
Pages: 2242
Type: BOOK - Published: 2008-08-06 - Publisher: Springer Science & Business Media
Covering all aspects of transport phenomena on the nano- and micro-scale, this encyclopedia features over 750 entries in three alphabetically-arranged volumes i
Language: en
Pages: 284
Pages: 284
Type: BOOK - Published: 2016-10-01 - Publisher:
Silicon (Si) is by far the most widely used semiconductor material for power devices. On the other hand, Si-based power devices are approaching their material l
Language: en
Pages: 477
Pages: 477
Type: BOOK - Published: 2006-05-24 - Publisher: Springer Science & Business Media
This book presents materials fundamentals of novel gate dielectrics that are being introduced into semiconductor manufacturing to ensure the continuous scalling